Pre-owned HITACHI S-3400N 2014 Inspection. This Inspection has average cutting time and is equipped with a CNC control. This CNC Machine is currently located in Pennsylvania. This HITACHI Inspection is available for a limited time. Get a quote today on this S-3400N before it's gone.
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Specs:
X Traverse 80mm 100mm
Y Traverse 40mm 50mm
Rotation 360o
Continuous 360o
Continuous
Z Traverse 5 – 35mm 5 – 65mm
Tilt Range -20o
to +90o -20° to +90o
Motorization Manual 5-Axis Eucentric
Observable Area 106mm dia. 130mm dia.
Max. Sample Height 40mm 85mm
Win7 Upgrade Type PCA
The Hitachi S-3400N SEM is a high performance, user-friendly scanning electron microscope with new improvements that allow the best results for a wide range of applications. Features include:
Unique VP-mode that allows microscopy of wet, oily and non-conductive samples in their natural state without the need of conventional sample preparation.
3.0 nm resolution guaranteed in high vacuum mode or 4.0 nm in VP-mode.
Resolution
3.0nm High Vacuum Mode
4.0nm Variable Pressure Mode
Chamber
Accomodates 10 inch specimen
Three high TOA ports for EDS, WEDS, EBSP, XRF, etc.
Stage
Fully eucentric, 5 axis computer controlled motorized stage
Electron Gun
Variable Quad Bian Circuitry with SE Accelerator Plate
Automation
Full automation including "no touch" objective aperture alignment
Vacuum
Turbo Molecular Pump (TMP)
Detectors
SE
BSE
CL
EDS
Y Traverse 40mm 50mm
Rotation 360o
Continuous 360o
Continuous
Z Traverse 5 – 35mm 5 – 65mm
Tilt Range -20o
to +90o -20° to +90o
Motorization Manual 5-Axis Eucentric
Observable Area 106mm dia. 130mm dia.
Max. Sample Height 40mm 85mm
Win7 Upgrade Type PCA
The Hitachi S-3400N SEM is a high performance, user-friendly scanning electron microscope with new improvements that allow the best results for a wide range of applications. Features include:
Unique VP-mode that allows microscopy of wet, oily and non-conductive samples in their natural state without the need of conventional sample preparation.
3.0 nm resolution guaranteed in high vacuum mode or 4.0 nm in VP-mode.
Resolution
3.0nm High Vacuum Mode
4.0nm Variable Pressure Mode
Chamber
Accomodates 10 inch specimen
Three high TOA ports for EDS, WEDS, EBSP, XRF, etc.
Stage
Fully eucentric, 5 axis computer controlled motorized stage
Electron Gun
Variable Quad Bian Circuitry with SE Accelerator Plate
Automation
Full automation including "no touch" objective aperture alignment
Vacuum
Turbo Molecular Pump (TMP)
Detectors
SE
BSE
CL
EDS
Further Reading
