X Traverse 80mm 100mm
Y Traverse 40mm 50mm
Z Traverse 5 – 35mm 5 – 65mm
Tilt Range -20o
to +90o -20° to +90o
Motorization Manual 5-Axis Eucentric
Observable Area 106mm dia. 130mm dia.
Max. Sample Height 40mm 85mm
Win7 Upgrade Type PCA
The Hitachi S-3400N SEM is a high performance, user-friendly scanning electron microscope with new improvements that allow the best results for a wide range of applications. Features include:
Unique VP-mode that allows microscopy of wet, oily and non-conductive samples in their natural state without the need of conventional sample preparation.
3.0 nm resolution guaranteed in high vacuum mode or 4.0 nm in VP-mode.
3.0nm High Vacuum Mode
4.0nm Variable Pressure Mode
Accomodates 10 inch specimen
Three high TOA ports for EDS, WEDS, EBSP, XRF, etc.
Fully eucentric, 5 axis computer controlled motorized stage
Variable Quad Bian Circuitry with SE Accelerator Plate
Full automation including "no touch" objective aperture alignment
Turbo Molecular Pump (TMP)